Dynamic voltage (IR) drop analysis and design closure: Issues and challenges

S K Nithin, G. Shanmugam, S. Chandrasekar
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引用次数: 60

Abstract

Dynamic voltage (IR) drop, unlike the static voltage drop depends on the switching activity of the design, and hence it is vector dependent. In this paper we have highlighted the pitfalls in the common design closure methodology that addresses static IR drop well, but often fails to bound the impact of dynamic voltage drops robustly. Factors that can affect the accuracy of dynamic IR analysis and the related metrics for design closure are discussed. A structured approach to planning the power distribution and grid for power managed designs is then presented, with an emphasis to cover realistic application scenarios, and how it can be done early in the design cycle. Care-about and solutions to avoid and fix the Dynamic voltage drop issues are also presented. Results are from industrial designs in 45nm process are presented related to the said topics.
动态电压(IR)下降分析和设计闭合:问题和挑战
与静态电压降不同,动态电压降取决于设计的开关活动,因此它是矢量相关的。在本文中,我们强调了通用设计闭合方法中的缺陷,该方法可以很好地解决静态IR降问题,但通常无法有效地约束动态电压降的影响。讨论了影响动态红外分析精度的因素和设计闭合的相关指标。然后提出了一种结构化的方法来规划电源管理设计的配电和电网,重点介绍了实际的应用场景,以及如何在设计周期的早期完成。提出了动态电压降问题的注意事项和解决方法。本文给出了与上述主题相关的45纳米工艺的工业设计结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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