Dielectric modeling, characterization, and validation up to 40 GHz

Abstract

As computer speeds continue to scale with Moore's law, improved transmission line modeling techniques are required for data rates greater than 3-5 gigabits per second (Gb/s). These transmission line models must accurately predict the interconnect characteristics to provide silicon designers correct channel parameters to ensure viable products. This work describes an analytic dielectric modeling methodology that produces accurate dielectric characteristics up to 40 GHz. Validation of multiple dielectric materials was performed up to 40 GHz by direct and indirect measurement techniques. The dielectric materials chosen for this study were based upon commonly available dielectrics that are suitable for high volume manufacturing in the printed wiring board industry.