RF and DC characteristics of low-leakage InAs/AlSb HFETs

B. Brar, G. Nagy, J. Bergman, G. Sullivan, P. Rowell, H. Lin, M. Dahlstrom, C. Kadow, M. Rodwell
{"title":"RF and DC characteristics of low-leakage InAs/AlSb HFETs","authors":"B. Brar, G. Nagy, J. Bergman, G. Sullivan, P. Rowell, H. Lin, M. Dahlstrom, C. Kadow, M. Rodwell","doi":"10.1109/LECHPD.2002.1146781","DOIUrl":null,"url":null,"abstract":"InAs/AlSb HFETs with excellent RF and DC properties are reported. The drain currents are 750 mA/mm. with peak transconductance g/sub m/ of 1.1 S/mm. The gate leakage is below 1 nA//spl mu/m/sup 2/ for low gate bias. The threshold voltages of 0.25 /spl mu/m and 0.5 /spl mu/m gate-length devices are -2.5 and -1.5 V respectively, indicating short channel effects are present. Small-signal measurements on a 0.25 /spl mu/m gate-length device show f/sub /spl tau// of 120 GHz and f/sub max/ of 100 GHz at drain voltages below 0.4 V.","PeriodicalId":137839,"journal":{"name":"Proceedings. IEEE Lester Eastman Conference on High Performance Devices","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE Lester Eastman Conference on High Performance Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LECHPD.2002.1146781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

InAs/AlSb HFETs with excellent RF and DC properties are reported. The drain currents are 750 mA/mm. with peak transconductance g/sub m/ of 1.1 S/mm. The gate leakage is below 1 nA//spl mu/m/sup 2/ for low gate bias. The threshold voltages of 0.25 /spl mu/m and 0.5 /spl mu/m gate-length devices are -2.5 and -1.5 V respectively, indicating short channel effects are present. Small-signal measurements on a 0.25 /spl mu/m gate-length device show f/sub /spl tau// of 120 GHz and f/sub max/ of 100 GHz at drain voltages below 0.4 V.
低漏InAs/AlSb hfet的RF和DC特性
报道了具有优异RF和DC特性的InAs/AlSb hfet。漏极电流为750ma /mm。峰值跨导g/sub /为1.1 S/mm。对于低栅极偏压,栅极漏电小于1 nA//spl μ /m/sup 2/。0.25 /spl mu/m和0.5 /spl mu/m栅长器件的阈值电压分别为-2.5 V和-1.5 V,表明存在短通道效应。在0.25 /spl mu/m门长器件上的小信号测量显示,漏极电压低于0.4 V时,f/sub /spl tau//为120 GHz, f/sub max/为100 GHz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信