Comparative Assessment of Digital and UHF Optoelectronic Transceivers Radiation Hardness

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889626

R. Mozhaev, M. Cherniak, A. Pechenkin, A. Ulanova, A. Nikiforov

引用次数: 0

Abstract

A method for radiation hardness evaluation of digital and microwave transmitting-receiving optoelectronic modules is presented. The technical aspects of parameters monitoring during exposure are described. The most vulnerable components of optoelectronic modules are identified.

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数字和超高频光电收发器辐射硬度的比较评估

提出了一种数字和微波收发光电模块的辐射硬度评估方法。描述了暴露期间参数监测的技术方面。确定了光电模块中最脆弱的组件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

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