Characterization of Metamaterial Interconnects

Abstract

In this paper, a metamaterial interconnect is investigated and evaluated through simulations and measurements. Short-pulse propagation technique is utilized to characterize the propagation constant of the metamaterial transmission line. The extracted beta is subsequently used in the design of a metamaterial backward coupler, which is compared with a conventional microstrip coupler experimentally. The metamaterial coupler demonstrates superior performance over its conventional microstrip counterpart.