The influence of interface states on the characteristics of HEMT DC output

Xinghong Zhang, G. Xia, Yuansen Xu, Yufen Yang, Zhanguo Wang
{"title":"The influence of interface states on the characteristics of HEMT DC output","authors":"Xinghong Zhang, G. Xia, Yuansen Xu, Yufen Yang, Zhanguo Wang","doi":"10.1109/ICSICT.1998.785977","DOIUrl":null,"url":null,"abstract":"The influence of interface states on the characteristics of AlGaAs/GaAs high electron mobility transistor (HEMT) direct current (DC) output has been quantitatively analyzed in the first time using an analytical model of HEMT DC output. Considering the action of the interface states in a AlGaAs/GaAs heterostructure, we have analyzed in detail the effect of interface states on I-V characteristics and transconductance of HEMT. Our calculated results show that the control capability of the gate voltage on the channel current reduces with increasing density of interface states, the transconductance of device decreases. Hence, the existence of the interface states degrades the performance of HEMT.","PeriodicalId":286980,"journal":{"name":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.1998.785977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The influence of interface states on the characteristics of AlGaAs/GaAs high electron mobility transistor (HEMT) direct current (DC) output has been quantitatively analyzed in the first time using an analytical model of HEMT DC output. Considering the action of the interface states in a AlGaAs/GaAs heterostructure, we have analyzed in detail the effect of interface states on I-V characteristics and transconductance of HEMT. Our calculated results show that the control capability of the gate voltage on the channel current reduces with increasing density of interface states, the transconductance of device decreases. Hence, the existence of the interface states degrades the performance of HEMT.
界面状态对HEMT直流输出特性的影响
本文首次利用高电子迁移率晶体管(HEMT)直流输出分析模型,定量分析了界面态对AlGaAs/GaAs高电子迁移率晶体管(HEMT)直流输出特性的影响。考虑到AlGaAs/GaAs异质结构中界面态的作用,我们详细分析了界面态对HEMT的I-V特性和跨导的影响。计算结果表明,栅极电压对通道电流的控制能力随着界面态密度的增加而降低,器件的跨导减小。因此,界面状态的存在降低了HEMT的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信