Impact of energy relaxation time on heat generation in silicon with electro-thermal analysis

T. Hatakeyama, R. Kibushi, M. Ishizuka
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Abstract

This paper describes heat generation in semiconductor depending on energy relaxation time between electron and lattice. Recently, power semiconductor devices are widely used in several areas, for example car electronics. Heat generation density in electrical devices has been increased with downsizing electrical devices. Then, thermal management of semiconductor devices is becoming key issue for further development of electrical devices. In this paper, estimation of heat generation in silicon under high electric filed was focused. Under high electric field, electron energy (electron temperature) becomes much higher than lattice energy (lattice temperature). Therefore, electro-thermal analysis was employed to consider non-equilibrium state between electron temperature and lattice temperature. Energy relaxation time between electron and lattice was varied as parameter and impact of energy relaxation time on estimated heat generation density was discussed.
用电热分析研究能量松弛时间对硅中热生成的影响
本文描述了半导体中电子与晶格之间的能量弛豫时间对热产生的影响。近年来,功率半导体器件在汽车电子等领域得到了广泛的应用。随着电气设备的小型化,电气设备的产热密度也随之增加。因此,半导体器件的热管理成为电气器件进一步发展的关键问题。本文主要研究了高电场作用下硅的热生成问题。在高电场作用下,电子能(电子温度)大大高于晶格能(晶格温度)。因此,采用电热分析来考虑电子温度与晶格温度之间的非平衡状态。研究了电子与晶格之间的能量弛豫时间随参数的变化,并讨论了能量弛豫时间对热密度的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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