Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References

N. V. Vonno, B. Williams, S. D. Turner, E. Thomson, Serge Bernard, D. Goodhew
{"title":"Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References","authors":"N. V. Vonno, B. Williams, S. D. Turner, E. Thomson, Serge Bernard, D. Goodhew","doi":"10.1109/REDW.2014.7004604","DOIUrl":null,"url":null,"abstract":"We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004604","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.
Intersil ISL71090SEH和ISL71091SEH精密电压基准的总剂量和单事件效应测试
我们报告了Intersil ISL71090SEH和ISL71091SEH硬化电压基准的SEE和低剂量率和高剂量率总剂量测试结果,并讨论了电气规格和制造工艺。
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