M. Basler, R. Reiner, S. Moench, P. Waltereit, R. Quay, Jörg Haarer
{"title":"Compact GaN Power ICs with Power HEMT, Gate Driver, Temperature Sensor, Current Sense-FET and Amplifier","authors":"M. Basler, R. Reiner, S. Moench, P. Waltereit, R. Quay, Jörg Haarer","doi":"10.1109/ISPSD57135.2023.10147498","DOIUrl":null,"url":null,"abstract":"This work presents the design and characterization of modular and compact GaN power ICs with power HEMT, gate driver, temperature sensor, current sense-FET and amplifier. These GaN ICs give the user high flexibility and versatility due to the modular approach. With a circuit design where bond pads are placed over the active periphery circuits a low area requirement below 25% of the total chip area is achieved. The sense-FET of a 100 V GaN power IC was measured in a half-bridge configuration with external amplifier to readout the sense-FET up to 48 V, 3 A, 100 kHz in hard- and soft-switching operation. The current-voltage ratio is −0.38 V/A. The temperature coefficient of the temperature sensor is 0.0031/K and the amplifier has a peak gain of 44. Thus, these GaN ICs give a compact and versatile solution for power electronics.","PeriodicalId":344266,"journal":{"name":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD57135.2023.10147498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This work presents the design and characterization of modular and compact GaN power ICs with power HEMT, gate driver, temperature sensor, current sense-FET and amplifier. These GaN ICs give the user high flexibility and versatility due to the modular approach. With a circuit design where bond pads are placed over the active periphery circuits a low area requirement below 25% of the total chip area is achieved. The sense-FET of a 100 V GaN power IC was measured in a half-bridge configuration with external amplifier to readout the sense-FET up to 48 V, 3 A, 100 kHz in hard- and soft-switching operation. The current-voltage ratio is −0.38 V/A. The temperature coefficient of the temperature sensor is 0.0031/K and the amplifier has a peak gain of 44. Thus, these GaN ICs give a compact and versatile solution for power electronics.