R. Gottschalg, J. A. del Cueto, T. Betts, S. Williams, D. Infield
{"title":"Investigating the seasonal performance of amorphous silicon single- and multi-junction modules","authors":"R. Gottschalg, J. A. del Cueto, T. Betts, S. Williams, D. Infield","doi":"10.1109/WCPEC.2003.1306358","DOIUrl":null,"url":null,"abstract":"The seasonal performance fluctuations observed in amorphous silicon solar cells are investigated. The dominant forces driving the increased efficiency in summer are identified, from long-term measurements, to be thermal annealing and spectral variations. A method for correcting for changes in the incident spectrum is applied in order to correct for the seasonal changes. In a second step, the fill factor is investigated in order to establish the magnitude of thermal annealing seen by these devices. The magnitude of each effect is investigated.","PeriodicalId":108816,"journal":{"name":"3rd World Conference onPhotovoltaic Energy Conversion, 2003. Proceedings of","volume":"52 3-4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"3rd World Conference onPhotovoltaic Energy Conversion, 2003. Proceedings of","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCPEC.2003.1306358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
The seasonal performance fluctuations observed in amorphous silicon solar cells are investigated. The dominant forces driving the increased efficiency in summer are identified, from long-term measurements, to be thermal annealing and spectral variations. A method for correcting for changes in the incident spectrum is applied in order to correct for the seasonal changes. In a second step, the fill factor is investigated in order to establish the magnitude of thermal annealing seen by these devices. The magnitude of each effect is investigated.