Symmetric CMOS in fully-depleted silicon-on-insulator using P/sup +/-polycrystalline SiGe gate electrodes

N. Kistler, J. Woo
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引用次数: 23

Abstract

In this work, polycrystalline SiGe gate electrodes have been implemented on fully-depleted silicon-on-insulator with light channel doping. Symmetric NMOS and PMOS operation is achieved, with threshold voltages in the range of 0.4-0.6 V. The devices exhibit good short-channel behavior and near-ideal subthreshold slope. CMOS ring oscillators with enhancement-mode NMOS and PMOS have been fabricated, exhibiting propagation delays comparable to previously reported values for fully-depleted SOI.<>
对称CMOS在完全耗尽的绝缘体上的硅使用P/sup +/-多晶SiGe栅极
在这项工作中,多晶SiGe栅极通过光通道掺杂在完全耗尽的绝缘体上的硅上实现。实现了NMOS和PMOS的对称工作,阈值电压在0.4-0.6 V范围内。该器件具有良好的短通道性能和接近理想的阈下斜率。具有增强模式NMOS和PMOS的CMOS环形振荡器已经被制造出来,其传播延迟与之前报道的完全耗尽SOI的值相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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