M. Ghannam, A. Al Omar, G. Flamand, N. Posthuma, J. Poortmans, R. Mertens
{"title":"Determination of band-gap narrowing in heavily doped n-type GaAs and n-type GaInP from solar cell performance","authors":"M. Ghannam, A. Al Omar, G. Flamand, N. Posthuma, J. Poortmans, R. Mertens","doi":"10.1109/ESSDER.2004.1356553","DOIUrl":null,"url":null,"abstract":"Band-gap narrowing (BGN) is determined in heavily doped n-type GaAs and n-type Ga/sub 0.5/In/sub 0.5/P from experimental pn junction solar cell performance. A BGN of 82 meV and of 17 meV is determined in GaAs with an n-type doping concentration of 2/spl times/10/sup 18//cm/sup 3/ and 10/sup 17//cm/sup 3/, respectively, and an average 95 meV BGN is determined in Ga/sub 0.5/In/sub 0.5/P with an n-type doping concentration of 3/spl times/10/sup 18//cm/sup 3/. These values agree well with theoretical predictions of a recent model applied to n-type GaAs and adapted here for Ga/sub 0.5/In/sub 0.5/P.","PeriodicalId":287103,"journal":{"name":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","volume":"17 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDER.2004.1356553","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Band-gap narrowing (BGN) is determined in heavily doped n-type GaAs and n-type Ga/sub 0.5/In/sub 0.5/P from experimental pn junction solar cell performance. A BGN of 82 meV and of 17 meV is determined in GaAs with an n-type doping concentration of 2/spl times/10/sup 18//cm/sup 3/ and 10/sup 17//cm/sup 3/, respectively, and an average 95 meV BGN is determined in Ga/sub 0.5/In/sub 0.5/P with an n-type doping concentration of 3/spl times/10/sup 18//cm/sup 3/. These values agree well with theoretical predictions of a recent model applied to n-type GaAs and adapted here for Ga/sub 0.5/In/sub 0.5/P.