iJTAG integration of complex digital embedded instruments

Ahmed M. Y. Ibrahim, H. Kerkhoff
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引用次数: 13

Abstract

Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.
iJTAG集成复杂数字嵌入式仪器
嵌入式仪器在现代soc中越来越多地用于不同的测试和测量目的。IEEE 1687 (iJTAG)是IEEE最新批准的嵌入式仪器访问和控制草案标准,基于广泛使用的IEEE 1149.1 TAP端口。本文将讨论为实现iJTAG控制、观察和重构复杂数字嵌入式仪器所做的工作。作为MPSoC可靠性管理解决方案的一部分,提出了两个数字嵌入式仪器作为案例研究,并说明了为实现iJTAG访问所做的工作。对iJTAG的控制、观察和重构进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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