C. Bradatsch, T. Ungerer, R. Zalman, Andre Lajtkep
{"title":"Towards runtime testing in automotive embedded systems","authors":"C. Bradatsch, T. Ungerer, R. Zalman, Andre Lajtkep","doi":"10.1109/SIES.2011.5953679","DOIUrl":null,"url":null,"abstract":"Runtime testing is a common way to detect faults during normal system operation. To achieve a specific diagnostic coverage runtime testing is also used in safety critical, automotive embedded systems. In this paper we propose a test architecture to consolidate the hardware resource consumption and timing needs of runtime tests and of application and system tasks in a hard real-time embedded system as applied to the automotive domain. Special emphasis is put to timing requirements of embedded systems with respect to hard real-time and concurrent hardware resource accesses of runtime tests and tasks running on the target system.","PeriodicalId":391594,"journal":{"name":"2011 6th IEEE International Symposium on Industrial and Embedded Systems","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th IEEE International Symposium on Industrial and Embedded Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIES.2011.5953679","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Runtime testing is a common way to detect faults during normal system operation. To achieve a specific diagnostic coverage runtime testing is also used in safety critical, automotive embedded systems. In this paper we propose a test architecture to consolidate the hardware resource consumption and timing needs of runtime tests and of application and system tasks in a hard real-time embedded system as applied to the automotive domain. Special emphasis is put to timing requirements of embedded systems with respect to hard real-time and concurrent hardware resource accesses of runtime tests and tasks running on the target system.