{"title":"Low-power design under variation using error prevention and error tolerance (invited paper)","authors":"Kwanyeob Chae, M. Cho, S. Mukhopadhyay","doi":"10.1109/LATW.2012.6261232","DOIUrl":null,"url":null,"abstract":"This paper presents error tolerance and error prevention methodologies to reduce power dissipation in digital circuits under process variations. For logic circuits, timing error prevention using time-borrowing and clock stretching is discussed as a feasible approach to reduce power dissipation for a target throughput. The natural error tolerance in image processing applications is exploited to reduce power dissipations in Static Random Access Memory (SRAM).","PeriodicalId":173735,"journal":{"name":"2012 13th Latin American Test Workshop (LATW)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th Latin American Test Workshop (LATW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2012.6261232","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents error tolerance and error prevention methodologies to reduce power dissipation in digital circuits under process variations. For logic circuits, timing error prevention using time-borrowing and clock stretching is discussed as a feasible approach to reduce power dissipation for a target throughput. The natural error tolerance in image processing applications is exploited to reduce power dissipations in Static Random Access Memory (SRAM).