Sebastian Schermer, C. Helke, Danhe Song, D. Reuter, H. Kuhn
{"title":"High-resolution projection lithography for MEMS-applications using thick photoresist AZ 10XT","authors":"Sebastian Schermer, C. Helke, Danhe Song, D. Reuter, H. Kuhn","doi":"10.1109/ssi56489.2022.9901437","DOIUrl":null,"url":null,"abstract":"In this paper, we are using high-resolution projection lithography together with AZ 10XT thick photoresist to realize an etching mask, which can be used for deep reactive ion etching (DRIE). With a design of experiment (DoE) suitable parameters for a full wafer level process are investigated. Structures with different size from 0.5 μm to 5 μm are used to find the highest aspect ratios for MEMS-applications.","PeriodicalId":339250,"journal":{"name":"2022 Smart Systems Integration (SSI)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Smart Systems Integration (SSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ssi56489.2022.9901437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we are using high-resolution projection lithography together with AZ 10XT thick photoresist to realize an etching mask, which can be used for deep reactive ion etching (DRIE). With a design of experiment (DoE) suitable parameters for a full wafer level process are investigated. Structures with different size from 0.5 μm to 5 μm are used to find the highest aspect ratios for MEMS-applications.