M. O’Bryan, K. Label, E. Wilcox, Dakai Chen, E. Wyrwas, M. Campola, M. Casey, J. Lauenstein, Alyson D. Topper, C. M. Szabo, J. Pellish, M. Berg, J. Lewellen, M. Holloway
{"title":"NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results","authors":"M. O’Bryan, K. Label, E. Wilcox, Dakai Chen, E. Wyrwas, M. Campola, M. Casey, J. Lauenstein, Alyson D. Topper, C. M. Szabo, J. Pellish, M. Berg, J. Lewellen, M. Holloway","doi":"10.1109/NSREC.2018.8584264","DOIUrl":null,"url":null,"abstract":"We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.","PeriodicalId":323166,"journal":{"name":"2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2018.8584264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.