Highly Reliable CW and Pulsed GaAs Read Diodes

S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank
{"title":"Highly Reliable CW and Pulsed GaAs Read Diodes","authors":"S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank","doi":"10.1109/EUMA.1976.332239","DOIUrl":null,"url":null,"abstract":"The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1976 6th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1976.332239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.
高可靠的连续波和脉冲砷化镓读出二极管
砷化镓读影响二极管的发展使得可靠、长寿命、高效率的连续波和脉冲中功率器件成为可能。使用具有生长的GaAs p-n结的hi-lo Read结构提供了长寿命和高效率的中功率器件。在2-3瓦的功率水平下,通常可以获得超过15%的连续波效率。标准的脉冲功率输出大于15瓦,效率为20%。对于脉冲器件,结果是在占空比为25%时获得的。由于这些性能,在结温为200°的情况下,寿命可以预测在107小时范围内。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信