S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank
{"title":"Highly Reliable CW and Pulsed GaAs Read Diodes","authors":"S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank","doi":"10.1109/EUMA.1976.332239","DOIUrl":null,"url":null,"abstract":"The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1976 6th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1976.332239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.