Optimizing of the material structure in AlGaN/GaN HEMTs through the energy band engineering approach

Miao Zhao, Xinyu Liu, Yingkui Zheng, Wei Ke
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Abstract

The performance of 2DEG in AlGaN/GaN HEMTs was investigated using the self-consistent solution of Poisson and Schrödinger equations, which in the simulation, the effects of the spontaneous and piezoelectric polarization were included. An optimized structure with cap layer yielded an increase in effective barrier height, with little penalty in sheet carrier concentration. The structure due to AlN interlayer was investigated by using the energy band calculation.
利用能带工程方法优化AlGaN/GaN hemt材料结构
利用泊松方程和Schrödinger方程的自一致解研究了2DEG在AlGaN/GaN hemt中的性能,其中在模拟中考虑了自发极化和压电极化的影响。带帽层的优化结构增加了有效阻挡高度,但对载流子浓度影响不大。利用能带计算方法研究了氮化铝中间层的结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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