Memory-like Defect Diagnosis for CMOL FPGAs

Abstract

Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.