Software and Hardware System for Charge Coupled Devices with Interline Transfer of Charge Parameters Monitoring During Radiation Tests

Abstract

The paper presents a method of device monitoring during radiation testing for charge coupled devices with interline transfer (hereinafter -– CCD). The results of heavy ions, dose rate and total ionizing dose tests are presented together with the description of the developed software and hardware set-up based on the National Instruments platform and on the designed specialized equipment adapted for radiation tests.