A Method and System Designed For Detecting the Thickness of Device by Using Half-Wave Full Transmission Principle

Jinyuan Guo, Cai-xia Wang, Yang-meng Tian, Song Jia, Hong-wei Wang, Jin Cheng
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Abstract

In this paper, a method based on half-wave full transmission principle is introduced to detect the thickness of the device. Firstly, acoustic signal penetrating through the device can be converted into electrical signal by using acoustic sensor. Then the A/D conversion module of STM32 is used to convert the electrical signal into digital signal. After that, through serial port communication, the data information collected by STM32 is transmitted to the computer and the threshold value is set by Matlab software. If the collected data is higher than the threshold value, it is considered qualified, and if it is less than the threshold value, it is considered unqualified, so as to analyze whether the thickness of the device is qualified. The system can provide new ideas and methods for detecting whether the thickness of the device is qualified and also save time, improve efficiency and accuracy.
利用半波全透射原理设计了一种检测器件厚度的方法和系统
本文介绍了一种基于半波全透射原理的器件厚度检测方法。首先,利用声传感器将穿透装置的声信号转换为电信号。然后利用STM32的A/D转换模块将电信号转换为数字信号。然后通过串口通信将STM32采集到的数据信息传输给计算机,并通过Matlab软件设置阈值。如果采集到的数据高于阈值,则认为合格,如果低于阈值,则认为不合格,从而分析设备的厚度是否合格。该系统为检测设备厚度是否合格提供了新的思路和方法,节省了时间,提高了效率和精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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