Annealed proton-exchanged planar lithium tantalate waveguides fabricated in concentrated and diluted pyrophosphoric acid

D. Kan, G. Yip
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Abstract

Lithium tantalate is a promising substrate for electro-optical integrated-optical devices because of its low sensitivity to optical damage and its high electro-optic coefficient. The annealed proton-exchange technique[1] (APE), which includes an additional annealing step after proton-exchange, is being established as a reliable method for producing stable, low-loss devices with little reduction in the electro-optic constant (from the bulk value). For the optimal design and fabrication of APE waveguide devices, accurate characterization data are necessary.
在浓缩和稀释焦磷酸中制备的退火质子交换平面钽酸锂波导
钽酸锂具有光学损伤敏感性低、电光系数高的特点,是一种很有前途的光电集成光学器件衬底材料。退火质子交换技术[1](APE),包括质子交换后的额外退火步骤,正在被确立为一种可靠的方法,用于生产稳定的低损耗器件,并且电光常数(从体积值)几乎没有降低。为了优化APE波导器件的设计和制造,精确的表征数据是必要的。
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