Exhaustive two-pattern generation with cellular automata

Abstract

Two-patterns are required to test a transistor stuck-open fault or a delay fault within a combinational circuit. Cellular automata (CA) has been proposed as a two pattern generator. For a 2n-cell CA structure, the condition to generate all possible exhaustive two-pattern n-bits have been investigated. Criteria to select the most desirable CA structure have also been laid down.<>