A 2.4 pJ ferroelectric-based non-volatile flip-flop with 10-year data retention capability

H. Kimura, T. Fuchikami, K. Marumoto, Y. Fujimori, S. Izumi, H. Kawaguchi, M. Yoshimoto
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引用次数: 19

Abstract

A ferroelectric-based (FE-based) non-volatile flip-flop (NWF) is proposed for low-power LSI. Since leakage current in a logic circuit can be cut off by non-volatile storage capability of NVFFs, the standby power is reduced to zero. The use of complementarily stored data in coupled FE capacitors makes it possible to achieve 88% reduction of FE capacitor size while maintaining a wide read voltage margin of 240mV (minimum) at 1.5V, which results in 2.4pJ low access energy with 10-year, 85°C data retention capability. An access speed of FE capacitors can be adaptively changed according to required retention time, which becomes 1.6/fS for 10-year data retention, and 170ns for 10-hour data retention. Especially, short-term data retention is suitable for power gating implementation. Applying the proposed circuitry in 32bit CPU of a vital sensor LSI, its power consumption becomes 13% of that of conventional one with area overhead of 64% using 130nm CMOS with Pb(Zr, Ti)O3(PZT) thin films.
具有10年数据保留能力的2.4 pJ铁电非易失性触发器
提出了一种用于低功耗大规模集成电路的铁电非易失性触发器(NWF)。由于nvff的非易失性存储能力可以切断逻辑电路中的泄漏电流,因此备用功率降至零。在耦合FE电容器中使用互补存储的数据,可以使FE电容器尺寸减小88%,同时在1.5V时保持240mV(最小)的宽读取电压裕度,从而实现2.4pJ的低存取能量,具有10年,85°C的数据保留能力。FE电容的访问速度可以根据需要的保留时间自适应改变,10年数据保留速度为1.6/fS, 10小时数据保留速度为170ns。特别是短期数据保留适合于功率门控实现。将该电路应用于关键传感器LSI的32位CPU中,采用Pb(Zr, Ti)O3(PZT)薄膜的130nm CMOS,其功耗为传统电路的13%,面积开销为传统电路的64%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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