From the present to the future: Scaling of planar VLSI-CMOS devices towards 3D-FinFETs and beyond 10nm CMOS technologies; manufacturing challenges and future technology concepts
{"title":"From the present to the future: Scaling of planar VLSI-CMOS devices towards 3D-FinFETs and beyond 10nm CMOS technologies; manufacturing challenges and future technology concepts","authors":"J. Hoentschel, A. Wei","doi":"10.1109/CSTIC.2015.7153333","DOIUrl":null,"url":null,"abstract":"Jan Hoentschel works for GLOBALFOUNDRIES as a Device Manager and is responsible for 28nm low power technologies. He manages an international device engineering team, which is handling several low power CMOS technologies starting from 40nm down to 28nm. Before he was working with Advanced Micro Devices and served several PD-SOI-CMOS device integrations from 130nm down to 32nm technologies for high performance microprocessors. In addition he was working within the product interaction and implementation group at AMD in Austin, TX. Jan Hoentschel is author and co-author of numerous technical papers and patents in the semiconductor field. He holds an MS and PhD in electrical engineering from the Technical University in Dresden as well as an MBA in General Management from the University of Applied Science Bielefeld. His research interests include HKMG, strain engineering, 3D FinFET device and technology concepts, lIIiV semiconductors and low power technologies on CMOS devices.","PeriodicalId":130108,"journal":{"name":"2015 China Semiconductor Technology International Conference","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 China Semiconductor Technology International Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2015.7153333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Jan Hoentschel works for GLOBALFOUNDRIES as a Device Manager and is responsible for 28nm low power technologies. He manages an international device engineering team, which is handling several low power CMOS technologies starting from 40nm down to 28nm. Before he was working with Advanced Micro Devices and served several PD-SOI-CMOS device integrations from 130nm down to 32nm technologies for high performance microprocessors. In addition he was working within the product interaction and implementation group at AMD in Austin, TX. Jan Hoentschel is author and co-author of numerous technical papers and patents in the semiconductor field. He holds an MS and PhD in electrical engineering from the Technical University in Dresden as well as an MBA in General Management from the University of Applied Science Bielefeld. His research interests include HKMG, strain engineering, 3D FinFET device and technology concepts, lIIiV semiconductors and low power technologies on CMOS devices.
Jan Hoentschel在GLOBALFOUNDRIES担任器件经理,负责28纳米低功耗技术。他管理着一个国际设备工程团队,该团队正在处理从40纳米到28纳米的几种低功耗CMOS技术。在此之前,他曾在Advanced Micro Devices工作,并为高性能微处理器的几种PD-SOI-CMOS器件集成提供服务,从130nm到32nm技术。此外,他还在位于德克萨斯州奥斯汀的AMD公司的产品交互和实施组工作。Jan Hoentschel是半导体领域许多技术论文和专利的作者和合著者。他拥有德累斯顿技术大学(Technical University in Dresden)电气工程硕士和博士学位,以及比勒费尔德应用科学大学(University of Applied Science Bielefeld)综合管理硕士学位。他的研究兴趣包括HKMG,应变工程,3D FinFET器件和技术概念,liiv半导体和CMOS器件的低功耗技术。