C. Osterwald, M. Campanelli, G. Kelly, Rafell Williams
{"title":"On the reliability of photovoltaic short-circuit current temperature coefficient measurements","authors":"C. Osterwald, M. Campanelli, G. Kelly, Rafell Williams","doi":"10.1109/PVSC.2015.7355842","DOIUrl":null,"url":null,"abstract":"The changes in short-circuit current of photovoltaic (PV) cells and modules with temperature are routinely modeled through a single parameter, the temperature coefficient (TC). This parameter is vital for the translation equations used in system sizing, yet in practice is very difficult to measure. In this paper, we discuss these inherent problems and demonstrate how they can introduce unacceptably large errors in PV ratings. A method for quantifying the spectral dependence of TCs is derived, and then used to demonstrate that databases of module parameters commonly contain values that are physically unreasonable. Possible ways to reduce measurement errors are also discussed.","PeriodicalId":427842,"journal":{"name":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2015.7355842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
The changes in short-circuit current of photovoltaic (PV) cells and modules with temperature are routinely modeled through a single parameter, the temperature coefficient (TC). This parameter is vital for the translation equations used in system sizing, yet in practice is very difficult to measure. In this paper, we discuss these inherent problems and demonstrate how they can introduce unacceptably large errors in PV ratings. A method for quantifying the spectral dependence of TCs is derived, and then used to demonstrate that databases of module parameters commonly contain values that are physically unreasonable. Possible ways to reduce measurement errors are also discussed.