Compendium of Recent SEE, and TID Test Results conducted by CNES from 2011-2016

Abstract

This paper reports the results and analysis of various total ionizing dose (TID) and single event effects (SEE) tests. The compendium covers devices tested by CNES from 2011 to 2016. The DUTs employed for the study include memories, microprocessors, logic families, converters, linear switches, linear amplifiers and others.