{"title":"Parasitic Gate Resistance and Switching Performance","authors":"A. Elbanhawy","doi":"10.1109/IPEMC.2006.4778345","DOIUrl":null,"url":null,"abstract":"In this paper we discusses in details the effect of the gate equivalent series resistance, ESR, of switching power MOSFETs on different aspects of loss mechanisms when used in DC-DC converters. The loss mechanisms addressed are current rise and fall times, die current distribution and localized shoot through","PeriodicalId":448315,"journal":{"name":"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPEMC.2006.4778345","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
In this paper we discusses in details the effect of the gate equivalent series resistance, ESR, of switching power MOSFETs on different aspects of loss mechanisms when used in DC-DC converters. The loss mechanisms addressed are current rise and fall times, die current distribution and localized shoot through