Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI:10.1109/IMTC.2002.1007212

P. Niewczas, L. Dziuda, G. Fusiek, A. J. Willshire, J. R. McDonald, G. Thursby, D. Harvey, W. Michie

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引用次数: 23

Abstract

In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.

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阵列波导光栅外源法布里-珀罗干涉传感器的研究

本文详细介绍了一种基于16通道阵列波导光栅(AWG)的固态讯问系统，用于讯问外源法布里-珀罗干涉(EFPI)传感器。所述传感元件配置为反射模式，并由宽带光源通过光纤照射。利用AWG装置作为粗谱仪对传感器反射的光谱进行分析。利用AWG通道的测量点，通过曲线拟合的方法重构了传感元件的原始光谱。这允许有足够的信息来唯一地确定反射峰(或倒峰)的位置，并获得测量量的值。除了提出的测量系统的理论模拟外，我们还提供了使用EFPI应变传感器进行实验室评估的细节。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)

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