Current status of GaN heterojunction bipolar transistors

M. Feng, R. K. Price, R. Chan, T. Chung, R. Dupuis, D. Keogh, J.C. Li, A. Conway, D. Qiao, S. Raychaudhuri, P. Asbeck
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引用次数: 2

Abstract

This paper reviews the current state-of-the-art GaN HBT results, and discusses the advantages of GaN HBTs over GaN HFETs and other material systems for high power amplifier applications. Technical difficulties associated with GaN HBTs such as MOCVD material growth, ICP dry etching, and ohmic contact issues are discussed. Methods for the elimination of technical issues and the authors' recommended approaches for practical realization of the GaN HBT-based RF high power amplifiers are described.
GaN异质结双极晶体管的研究现状
本文回顾了目前最先进的GaN HBT结果,并讨论了GaN HBT相对于GaN hfet和其他材料系统在高功率放大器应用中的优势。与GaN hbt相关的技术困难,如MOCVD材料生长,ICP干蚀刻和欧姆接触问题进行了讨论。介绍了消除技术问题的方法和作者推荐的实际实现基于GaN hbt的射频高功率放大器的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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