Fast and low-temperature sputtering epitaxy of Si and Ge and its application to optoelectronics

W. Yeh, M. Matsumoto, K. Sugihara
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Abstract

Novel Si/SiGex-Ge multi-junction solar cell structure was proposed, and pin junction Ge solar cell was fabricated on Ge substrate by sputter epitaxy for the first time, in which growth temperature was under 360°C and growth rates was ~2 nm/s. Internal quantum efficiency at infrared wavelength was as high as 76%, with an open circuit voltage of 0.15V.
Si和Ge的快速低温溅射外延及其在光电子学中的应用
提出了一种新型的Si/SiGex-Ge多结太阳能电池结构,并首次采用溅射外延技术在Ge衬底上制备了生长温度低于360℃、生长速率为~2 nm/s的引脚结锗太阳电池。红外波长内量子效率高达76%,开路电压为0.15V。
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