{"title":"Multi-programming environment for structure under pads (SUP) and via arrays pattern recognition automated classification system","authors":"S. Yusof, Lau Meng Tee","doi":"10.1109/ISQED.2010.5450519","DOIUrl":null,"url":null,"abstract":"In today's IC Design, EDA tools are not limited to IC designer's toys. The application of EDA has expanded into a larger scope including generation and extraction of critical information of a design for yield, quality and reliability analysis.","PeriodicalId":369046,"journal":{"name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2010.5450519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In today's IC Design, EDA tools are not limited to IC designer's toys. The application of EDA has expanded into a larger scope including generation and extraction of critical information of a design for yield, quality and reliability analysis.