Towards heterogeneous microsystems design-for-test in a graduate student environment

P. Stokes, R. Mallard
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Abstract

Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.
面向研究生环境的异构微系统测试设计
异质微系统的微加工技术的进步使越来越复杂的器件成为可能。建模、仿真和测试方法无法跟上发展的步伐。定制的测试解决方案需要大量的资源来实现,并且通常是不可重用的。设备不按预期运行是难以诊断的。硅微电子设计人员熟悉的可测试性设计技术可以为验证和调试设计提供解决方案。需要的是在快速原型环境中进行系统设计和操作算法优化,并将可测试性设计考虑在内。大学的研究环境特别适合开发这样的环境。在本文中,我们回顾了一些由研究生在基于微系统的传感器系统上进行的通用测试。从研究基础设施的角度来看,我们提出了对大学概念验证环境的改进,以促进在异构微系统中添加面向测试的设计功能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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