On-board non-regression test of HLS tools targeting FPGA

Arief Wicaksana, Adrien Prost-Boucle, O. Muller, F. Rousseau, A. Sasongko
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引用次数: 5

Abstract

High-Level Synthesis (HLS) has opened an opportunity for software programmers to target FPGA more rapidly. When developing HLS tools, tests are desirable to ensure their function, reliability and performance. When modifications are applied to a tool, Non- Regression Test (NRT) asserts that the changes have intended effect while Regression Test (RT) verifies that the tool still performs correctly without unwanted behaviour. The work presented in this paper is focused on a method to automatically perform Non-Regression Test in HLS tool developments, although it can also be used as a Regression Testing technique. This method relies on a framework which allows HLS tool developers to verify the circuits generated from the tool directly on FPGA, instead of using simulations. The verification flow is automatic, so that knowing the details of the system is unnecessary for developers. The framework has been tested successfully over several applications from HLS benchmark and it gives more promising results than its simulation counterpart.
针对FPGA的HLS工具的板载非回归测试
高级综合(High-Level Synthesis, HLS)为软件程序员更快速地瞄准FPGA提供了机会。在开发HLS工具时,需要进行测试以确保其功能、可靠性和性能。当修改应用于工具时,非回归测试(NRT)断言更改具有预期的效果,而回归测试(RT)验证工具仍然正确执行,没有不必要的行为。本文提出的工作重点是在HLS工具开发中自动执行非回归测试的方法,尽管它也可以用作回归测试技术。该方法依赖于一个框架,该框架允许HLS工具开发人员直接在FPGA上验证由该工具生成的电路,而不是使用模拟。验证流程是自动的,因此开发人员不需要知道系统的细节。该框架已在HLS基准测试的几个应用程序上进行了成功的测试,并给出了比模拟对应物更有希望的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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