Monte Carlo simulation of InGaAs/InAlAs HEMTs with a quantum correction potential

Bo Wu, T. Tang
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Abstract

In Monte Carlo simulation of high electron mobility transistors (HEMTs), how to position the source and drain contacts will significantly affect the drain current. Unlike many Monte Carlo (MC) simulations of HEMTs in the past, in this work, the source and drain contacts are placed on the top of the caps as in the real device instead of on the side adjacent to the channel. In addition, to taking the quantum effects into consideration, the effective potential approach of quantum correction has been incorporated into our MC simulator. We have found that the simulated drain current is substantially increased compared to that of using the classical potential.
具有量子校正势的InGaAs/InAlAs hemt的Monte Carlo模拟
在高电子迁移率晶体管(hemt)的蒙特卡罗模拟中,源极和漏极触点的位置将对漏极电流产生重要影响。与过去许多hemt的蒙特卡罗(MC)模拟不同,在这项工作中,源极和漏极触点像在实际设备中一样被放置在盖子的顶部,而不是靠近通道的一侧。此外,为了考虑量子效应,我们在MC模拟器中引入了量子校正的有效势能方法。我们发现,与使用经典电势相比,模拟漏极电流大大增加。
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