{"title":"A test controller board for TSS","authors":"K. Kornegay, R. Brodersen","doi":"10.1109/GLSV.1991.143939","DOIUrl":null,"url":null,"abstract":"The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described.<<ETX>>","PeriodicalId":261873,"journal":{"name":"[1991] Proceedings. First Great Lakes Symposium on VLSI","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings. First Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GLSV.1991.143939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described.<>