{"title":"Advanced IC technologies I","authors":"A. Loke, D. Sunderland","doi":"10.1109/CICC.2012.6330656","DOIUrl":null,"url":null,"abstract":"This all-Invited session covers advanced technologies, including the first production tri-gate devices, ultra-thin SOI, reliability challenges for scaled CMOS, and SiC devices for power management.","PeriodicalId":130434,"journal":{"name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2012.6330656","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This all-Invited session covers advanced technologies, including the first production tri-gate devices, ultra-thin SOI, reliability challenges for scaled CMOS, and SiC devices for power management.