An electrical-level superposed-edge approach to statistical serial link simulation

M. Tsuk, D. Dvorscak, Chin Siong Ong, Jacob K. White
{"title":"An electrical-level superposed-edge approach to statistical serial link simulation","authors":"M. Tsuk, D. Dvorscak, Chin Siong Ong, Jacob K. White","doi":"10.1145/1687399.1687533","DOIUrl":null,"url":null,"abstract":"Brute-force simulation approaches to estimating serial-link bit-error rates (BERs) become computationally intractable for the case when BERs are low and the interconnect electrical response is slow enough to generate intersymbol interference that spans dozens of bit periods. Electrical-level statistical simulation approaches based on superposing pulse responses were developed to address this problem, but such pulse-based methods have difficulty analyzing jitter and rise/fall asymmetry. In this paper we present a superposing-edge approach for statistical simulation, as edge-based methods handle rise/fall asymmetry and jitter in straightforward way. We also resolve a key problem in using edge-based approaches, that edges are always correlated, by deriving an efficient inductive approach for propagating the edge correlations. Examples are presented demonstrating the edge-based method's accuracy and effectiveness in analyzing combinations of uniform, Gaussian, and periodic distributed random jitter.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1687399.1687533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

Brute-force simulation approaches to estimating serial-link bit-error rates (BERs) become computationally intractable for the case when BERs are low and the interconnect electrical response is slow enough to generate intersymbol interference that spans dozens of bit periods. Electrical-level statistical simulation approaches based on superposing pulse responses were developed to address this problem, but such pulse-based methods have difficulty analyzing jitter and rise/fall asymmetry. In this paper we present a superposing-edge approach for statistical simulation, as edge-based methods handle rise/fall asymmetry and jitter in straightforward way. We also resolve a key problem in using edge-based approaches, that edges are always correlated, by deriving an efficient inductive approach for propagating the edge correlations. Examples are presented demonstrating the edge-based method's accuracy and effectiveness in analyzing combinations of uniform, Gaussian, and periodic distributed random jitter.
统计串行链路仿真的电学级叠加边缘方法
当误码率较低且互连电响应缓慢到足以产生跨越数十个比特周期的符号间干扰时,估计串行链路误码率的暴力模拟方法在计算上变得难以处理。为了解决这一问题,开发了基于叠加脉冲响应的电级统计模拟方法,但这种基于脉冲的方法难以分析抖动和上升/下降不对称性。在本文中,我们提出了一种用于统计模拟的叠加边缘方法,因为基于边缘的方法可以直接处理上升/下降不对称和抖动。我们还通过推导一种有效的归纳方法来传播边缘相关性,解决了使用基于边缘的方法中的一个关键问题,即边缘总是相关的。举例说明了基于边缘的方法在分析均匀、高斯和周期分布随机抖动组合时的准确性和有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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CiteScore
4.60
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0.00%
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