Design for testability reuse in synthesis for testability

P. Bukovjan, M. Marzouki, W. Maroufi
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引用次数: 2

Abstract

This paper presents our Design for Testability reuse approach implemented in the allocation for testability system IDAT. In the context of High-Level Synthesis for Testability, the allocation for testability process mainly consists in searching for the best cost/quality trade-off between the designer requirements and testability means which can be proposed by the system, considering the available components in the library and the possibility of generating additional testability structures. The cost/quality trade-off is also based on the result of the testability analysis process.
为可测试性而设计,在可测试性的综合中重用
本文提出了在可测试性系统IDAT分配中实现可测试性复用设计的方法。在可测试性高级综合的背景下,可测试性过程的分配主要包括在考虑库中可用组件和生成额外可测试性结构的可能性的情况下,在设计者的需求和系统可以提出的可测试性手段之间寻找最佳的成本/质量权衡。成本/质量的权衡也是基于可测试性分析过程的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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