Modeling interference coupling between two orthogonal strip lines on adjacent layers

K. Araki, F. Xiao, Y. Kami, H. Bishnoi, J. Drewniak
{"title":"Modeling interference coupling between two orthogonal strip lines on adjacent layers","authors":"K. Araki, F. Xiao, Y. Kami, H. Bishnoi, J. Drewniak","doi":"10.1109/EMCEUROPE.2008.4786849","DOIUrl":null,"url":null,"abstract":"In multi-layer circuit boards of modern electronic equipment, signal lines and power distribution traces can be set orthogonally and sandwiched between two reference layers. To evaluate interference between such a intersecting strip line geometry, a lumped mutual capacitance model is proposed. Determining the scalar potential due to an assumed line charge at the intersection of the orthogonal traces leads to the distributed mutual capacitance between two lines. The results show that for typical printed circuit board geometries, the mutual capacitance can be approximated as a lumped element at the intersection of the two orthogonal strip line geometries. The proposed model is verified by comparing experimental and the computed results.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

In multi-layer circuit boards of modern electronic equipment, signal lines and power distribution traces can be set orthogonally and sandwiched between two reference layers. To evaluate interference between such a intersecting strip line geometry, a lumped mutual capacitance model is proposed. Determining the scalar potential due to an assumed line charge at the intersection of the orthogonal traces leads to the distributed mutual capacitance between two lines. The results show that for typical printed circuit board geometries, the mutual capacitance can be approximated as a lumped element at the intersection of the two orthogonal strip line geometries. The proposed model is verified by comparing experimental and the computed results.
模拟相邻层上两条正交带状线之间的干涉耦合
在现代电子设备的多层线路板中,信号线和配电走线可以正交设置,夹在两个参考层之间。为了评估这种相交带状线几何之间的干涉,提出了集总互电容模型。确定在正交走线的交点处假定的线电荷所引起的标量电位,可得出两条线之间的分布互电容。结果表明,对于典型的印刷电路板几何形状,互电容可以近似为两个正交带线几何形状交点处的集总元。通过实验与计算结果的对比,验证了所提模型的正确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信