Comparative Study of Evolutionary Algorithms for a Hybrid Analog Design Optimization with the use of Deep Neural Networks

Ahmed Elsiginy, E. Azab, M. Elmahdy
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Abstract

Analog design optimization is the process of optimizing the circuit parameters to achieve specific performance metrics. In order to choose the best optimization methodology, a comparative study between different methodologies is needed. This work introduces hybrid design optimization method that combines Evolutionary Algorithms (EA) such as Particle Swarm Optimization (PSO) or Genetic Algorithm (GA) with a multi-output Deep Neural Network (DNN) to obtain both fast and accurate circuit optimizer. A CMOS Miller op-amp is used as an example of the optimization problem. Training data for the DNN is extracted with Mentor Analog Fast Spice (AFS) and using TSMC 90nm PDK. This work gives important insights on how to choose the best DNN structure by showing that using Adadelta optimizer in the DNN training phase is the best compared to Adagrad and Gradient Descent(GD). Moreover, it is proven that there is an optimum size of the DNN to achieve the least prediction error. Finally, a comparative study between PSO and GA algorithms proved that PSO has less failure rate for all test iterations.
混合模拟设计优化的进化算法与深度神经网络的比较研究
模拟设计优化是优化电路参数以达到特定性能指标的过程。为了选择最佳的优化方法,需要对不同方法进行比较研究。本文介绍了一种混合设计优化方法,该方法将进化算法(EA)如粒子群优化(PSO)或遗传算法(GA)与多输出深度神经网络(DNN)相结合,以获得快速准确的电路优化器。以CMOS米勒运放为例,说明了优化问题。DNN的训练数据使用Mentor Analog Fast Spice (AFS)和TSMC 90nm PDK提取。这项工作通过显示在DNN训练阶段使用Adadelta优化器与Adagrad和梯度下降(GD)相比是最好的,为如何选择最佳DNN结构提供了重要的见解。此外,还证明了存在一个最优DNN的大小以实现最小的预测误差。最后,通过对粒子群算法和遗传算法的比较研究,证明粒子群算法在所有测试迭代中都具有较小的故障率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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