Nonlinear FET Modeling from a Single NVNA Measurement by Nonlinear Function Sampling

Abstract

We propose an automatic method for FET quasi-static (QS) modeling based on just one full-swing, full-bandwidth (BW) Nonlinear Vector Network Analyzer (NVNA) measurement under a specific two-tone excitation. The procedure leverages on a newly defined Nonlinear Function Sampling (NFS) operator and on 2D time-domain waveform analysis, allowing for model identification by just solving a system of linear equations. The model has been validated under continuous-wave (CW) operation at 2.5 and 5 GHz, and for 3rd-order intermodulation distortion (IM3) prediction at 2.5 GHz.