Design and validation of a platform for electromagnetic fault injection

J. Balasch, D. Arumí, S. Manich
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引用次数: 13

Abstract

Security is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One of the most powerful techniques to compromise the correct functioning of a device are fault injection attacks. They enable an active adversary to trigger errors on a circuit in order to bypass security features or to gain knowledge of security-sensitive information. There are several methods to induce such errors. In this work we focus on the injection of faults through the electromagnetic (EM) channel. In particular, we document our efforts towards building a suitable platform for EM pulse injection. We design a pulse injection circuit that can provide currents over 20 A to an EM injector in order to generate abrupt variations of the EM field on the vicinity of a circuit. We validate the suitability of our platform by applying a well-know attack on an embedded 8-bit microcontroller implementing the AES block cipher. In particular, we show how to extract the AES secret cryptographic keys stored in the device by careful injection of faults during the encryption operations and simple analysis of the erroneous outputs.
电磁故障注入平台的设计与验证
安全性被认为是嵌入式电路设计和部署的主要挑战之一。设备需要在现场安全、正确地运行,即使在潜在对手的物理范围内。破坏设备正常功能的最强大技术之一是故障注入攻击。它们使活跃的攻击者能够触发电路上的错误,以绕过安全功能或获取安全敏感信息的知识。有几种方法可以引起这种错误。在这项工作中,我们的重点是通过电磁通道注入故障。特别是,我们记录了我们为建立一个合适的电磁脉冲注入平台所做的努力。我们设计了一种脉冲注入电路,可以为电磁注入器提供超过20 a的电流,以便在电路附近产生电磁场的突变。我们通过在实现AES分组密码的嵌入式8位微控制器上应用众所周知的攻击来验证我们平台的适用性。特别是,我们展示了如何通过在加密操作期间小心地注入错误和简单地分析错误输出来提取存储在设备中的AES秘密加密密钥。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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