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ASIC Based LVDT Signal Conditioner for High-Accuracy Measurements

International Symposium on VLSI Design and Test Pub Date : 2019-07-04 DOI:10.1007/978-981-32-9767-8_33
K. P. Raghunath, K. Sagar, T. Gokulan, Kundan Kumar, C. S. Thakur
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基于ASIC的高精度测量LVDT信号调节器
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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International Symposium on VLSI Design and Test
International Symposium on VLSI Design and Test
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