Y. Mima, K. Kimura, T. Inao, N. Oyabu, Noriaki Kimura
{"title":"Failure analysis of electric circuit board by high resolution magnetic field microscopy","authors":"Y. Mima, K. Kimura, T. Inao, N. Oyabu, Noriaki Kimura","doi":"10.1109/ICSJ.2013.6756129","DOIUrl":null,"url":null,"abstract":"In this paper, we demonstrate various electric current imaging using electromagnetic field reconstruction method, and show its capability of reducing stray magnetic field effect.","PeriodicalId":101667,"journal":{"name":"2013 3rd IEEE CPMT Symposium Japan","volume":"338 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 3rd IEEE CPMT Symposium Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSJ.2013.6756129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this paper, we demonstrate various electric current imaging using electromagnetic field reconstruction method, and show its capability of reducing stray magnetic field effect.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
