The Materials Analysis patticle Probe (MAPP) diagnostic system in NSTX

B. Heim, S. Gonderman, C. Taylor, J. Allain, Z. Yang, M. González, E. Collins, C. Skinner, B. Ellis, W. Blanchard, L. Roquemore, H. Kugel, R. Martín
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Abstract

Lithium conditioning of plasma-facing surfaces (PFS) has been implemented in NSTX leading to improvements in plasma performance such as reduced D recycling and a reduction in edge localized modes (ELMS). Analysis of post-mortem tiles and offline experiments has identified interactions between Li-O-D and Li-C-D as chemical channels for deuterium retention in ATJ graphite. MAPP is the first in-vacuo surface analysis diagnostic directly integrated into a tokamak and capable of shot-to-shot chemical surface analysis of plasma material interactions (PMI). X-ray photoelectron spectroscopy (XPS) and low energy ion surface spectroscopy (LEISS) can show the chemical functionalities between D and lithiated graphite at both the near surface (5–10 nm) and top surface layer (0.3–0.6 nm) for XPS and LEISS respectively. MAPP will correlate plasma facing component (PFC) surface chemistry with plasma performance to lead the way to improved understanding of plasma-surface interactions and their effect on global plasma performance. Remote operation and data acquisition, integrated into NSTX diagnostic and interlocks, make MAPP an advanced PMI diagnostic with stringent engineering constraints.
NSTX的材料分析颗粒探针(MAPP)诊断系统
锂离子对等离子体表面(PFS)的调理已经在NSTX中实现,从而改善了等离子体性能,如减少D循环和减少边缘局域模式(ELMS)。死后瓦片分析和离线实验已经确定了锂- o - d和锂- c - d之间的相互作用是ATJ石墨中氘保留的化学通道。MAPP是第一个直接集成到托卡马克的真空表面分析诊断系统,能够对等离子体材料相互作用(PMI)进行化学表面分析。x射线光电子能谱(XPS)和低能离子表面能谱(LEISS)分别在近表面(5 ~ 10 nm)和上表层(0.3 ~ 0.6 nm)显示了D与锂化石墨之间的化学功能。MAPP将把等离子体面向组分(PFC)表面化学与等离子体性能联系起来,从而提高对等离子体表面相互作用及其对整体等离子体性能的影响的理解。远程操作和数据采集,集成到NSTX诊断和联锁中,使MAPP成为具有严格工程约束的先进PMI诊断。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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