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An Efficient Test and Fault Tolerance Technique for Paper-Based DMFB

International Symposium on VLSI Design and Test Pub Date : 2019-07-04 DOI:10.1007/978-981-32-9767-8_7
Chandan Das, Sarit Chakraborty, Susanta Chakraborty
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基于纸张的DMFB的有效测试和容错技术
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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International Symposium on VLSI Design and Test
International Symposium on VLSI Design and Test
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