Impact of Double-Row Height Standard Cells on Placement and Routing

Rung-Bin Lin, Yu-Xiang Chiang
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引用次数: 2

Abstract

In this article we propose a systematic method to study how increasing use of double-row height cells would impact placement and routability of a circuit. To facilitate our study, we handcraft 87 standard cells, each of which has two layouts of the same area, one designed with single-row height and the other designed with double-row height. Experimental results show that the compromise made by placement, later turned into routability degradation, for handling double-row height cells reaches its peak when a circuit has about 30% of the cells being double-row height cells if placement is done with a core utilization of 90%. It is about 40% if a core utilization of 80% is employed.
双排高度标准单元对放置和路由的影响
在本文中,我们提出了一种系统的方法来研究增加双排高度单元的使用将如何影响电路的放置和可达性。为了便于我们的研究,我们手工制作了87个标准单元格,每个单元格都有两种相同面积的布局,一种设计为单行高,另一种设计为双行高。实验结果表明,如果以90%的核心利用率进行放置,则当电路中约有30%的单元是双行高度单元时,处理双行高度单元所做出的妥协(后来转化为可达性退化)达到峰值。如果采用80%的核心利用率,则约为40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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