Study of tube storage life degradation by means of mass spectrometer analysis

H. Gray, G. A. Haas, R.E. Thomas, T. Pankey
{"title":"Study of tube storage life degradation by means of mass spectrometer analysis","authors":"H. Gray, G. A. Haas, R.E. Thomas, T. Pankey","doi":"10.1109/IEDM.1976.189130","DOIUrl":null,"url":null,"abstract":"Electron tubes with small internal volume often fail by arcing when turned on after extended shelf life. We have identified the major failure mechanism in a particular tube type which has an internal volume of 0.1 cm3by using quadrupole mass analysis (QMA) of internal gases and Auger electron spectroscopy (AES) of impurity deposits on internal electrodes. The major failure mechanism is the release of nitrogen from ceramic voids during microcrack propagation. This gas adsorbs on the filament, electrodes, and internal tube surfaces and is released by thermal and electron stimulated desorption when the tube is turned on.","PeriodicalId":106190,"journal":{"name":"1976 International Electron Devices Meeting","volume":"19 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1976 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1976.189130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Electron tubes with small internal volume often fail by arcing when turned on after extended shelf life. We have identified the major failure mechanism in a particular tube type which has an internal volume of 0.1 cm3by using quadrupole mass analysis (QMA) of internal gases and Auger electron spectroscopy (AES) of impurity deposits on internal electrodes. The major failure mechanism is the release of nitrogen from ceramic voids during microcrack propagation. This gas adsorbs on the filament, electrodes, and internal tube surfaces and is released by thermal and electron stimulated desorption when the tube is turned on.
质谱分析方法对管道贮存寿命退化的研究
内部体积较小的电子管,在超长保质期后打开时,往往会发生电弧失效。我们利用内部气体的四极杆质量分析(QMA)和内部电极杂质沉积的俄歇电子能谱(AES)确定了内体积为0.1 cm3的特定管型的主要失效机制。微裂纹扩展过程中氮的释放是破坏的主要机制。这种气体吸附在灯丝、电极和内管表面上,当管子打开时,通过热和电子刺激解吸释放出来。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信